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The Applied Vericell Solar Wafer Inspection System is the industry’s most advanced fully automated bare wafer inspection tool for crystalline silicon PV wafer and cell production. The Applied Vericell system’s multiple integrated inspection modules automatically evaluate each wafer to find and eliminate defective wafers from production, resulting in significant manufacturing savings. The Vericell measures and reports on a wide range of parameters including wafer thickness, thickness variations, warp and resistivity. Vericell also detects defects including saw marks, chipped edges, damaged chamfers, stains, pin holes and micro-cracks.
Through the use of state-of-the-art photoluminescence (PL) technology, the Vericell can automatically predict final cell efficiency from bare multi-crystalline wafer material with an average prediction error of less than 0.1%. By removing low-efficiency wafers and identifying wafers that require process modifications, Vericell customers can achieve overall improvement in their factory’s average cell efficiency yield and increase factory profitability. In addition, Vericell delivers the lowest breakage rate in the industry with the highest inspection throughput of up to 5,400 wafers per hour.
The Vericell Solar Wafer Inspection System combines high productivity with unique advanced inspection techniques that meet SEMI® solar standards to optimize the entire manufacturing line.