Applied MDLx^™ Ginestra^® Simulation Software

Ginestra^® is a software product designed to simulate the operation and electrical characteristics of modern logic (e.g., FinFET, FeFET) and memory (e.g., Flash, RRAM, CBRAM, FeRAM, PCM) devices, with a particular focus on dielectric-related phenomena and novel materials. The software is based on a multiscale modeling approach and relies on a comprehensive physics-based description of charge/ion transport; charge trapping; and material modifications due to different phenomena such as degradation, polarization switching, phase change, and more.

Ginestra includes a Device Creation Tool to design custom devices and a full set of simulation modules reproducing the main electrical measurements typically considered for device characterization and qualification, such as I-V, C-V, BTI, $V$T shift, SILC, and electrical stress, and to predict reliability/variability. It can be used as a virtual electrical measurement lab to design and perform virtual electrical experiments. This allows testing of multiple ideas and structures before going to the lab, thereby accelerating development cycle times and saving significant cost.