Products & Technologies
Products & Technologies
Services
Resources
Products & Technologies
Services
Resources
A critical part of the R&D process is exploring new materials, processes, transistor device architectures, design architectures, packaging and system architectures. Further, Applied Materials believes evaluating the PPACt impact of these innovations at the system level is an important part of the R&D Process. We have built engineering capability and developed a suite of productivity enhancement tools to drive R&D acceleration of Systems to Technology Co-optimization (STCO).
Productivity Enhancement Tools:
Ginestra integrates relevant physics, critical to understanding and managing the complexity of materials-to-device co-optimization from materials discovery through device performance, reliability and variability projection. Applied’s design and simulation platform accelerates materials-to-device innovation, providing atomic level insights to improve performance, power, area, cost and time to market.
With Ginestra You Can:
The technology challenges in making advanced semiconductor processes work with acceptable yield are immense. These, together with additional design challenges and constraints, result in a huge and complex set of design rules. Developing such rules, capturing them clearly, and ensuring their intent is correctly and accurately embodied in downstream PDKs is a major challenge. The iDRM platform enables easy and clear capture of design rules, managing them and ensuring their implementation accuracy.
iDRM Features and Benefits:
Standard-cell libraries are the essential elements that make up every logic block and sub-system. The library architecture, composition and design quality determine the final power, performance and area of any digital IC product. SLIC enables customers to quickly generate complete standard cell libraries optimized for different design styles and goals - from months to days.
With SLiC You Can:
DRC runsets are the final check, or line of defense, against design errors and potential silicon failures that might result in high cost of design respins and disrupted production yield ramp. Therefore, the integrity and correctness of these DRC runsets cannot be overstated. This is especially true for new technology and process design kits (PDK).
With DRVerify You Can: