nanochip fab solutions
By Llew Vaughan-Edmunds
As technology evolves, so does the demand for more power. Wide bandgap (WBG) materials such as gallium nitride (GaN) are demonstrating their potential as the backbone of next-generation power semiconductors.
By Chris Reeves and Ben Williams
Applied Materials’ new Applied SmartFactory® Fault Detection solution offers an economic, easy-to-implement way to improve tool and process performance in the back end.
By Selim Nahas
Applied Materials is developing a quality improvement strategy that combines quality data in a cohesive and automated manner and maps the results into a Failure Mode and Effects Analysis (FMEA) system that provides users with recommended actions.