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nanochip fab solutions

Nanochip 快讯,2016年10月

Nanochip Express - Fall 2016

Chamber Matching—Easier Said Than Done

By Kevin Sannes

It seems easy enough: to maximize production of a given product, simply optimize the operating parameters of one “golden” tool and then duplicate them exactly across all the tools in the fleet to obtain perfectly matched performance. However, chamber matching is a prime example of the axiom "easier said than done."

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Nanochip Express - Fall 2016

Micro-Arcing During High-Density Plasma Chemical Vapor Deposition

By Calvin Chang, Joseph Farah and Lin Zhang

This article discusses micro-arcing and a new service strategy to help device makers manage particle contamination, wafer scrap, yield loss and tool downtime.

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Nanochip Express - Fall 2016

检验太阳能晶圆: 修复看不见的缺陷

By Asaf Schlezinger

创新的质检工具和成品率管理工具有助于太阳能制造商提高成品率和产品质量。

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Nanochip Express - Fall 2016

28th Annual U.S. APC Conference: Challenges and Practical Solutions in Advanced Process Control

By Nanochip Staff

Get the latest information on fault detection (FD) control, run-to-run (R2R) control, predictive technologies including virtual metrology and predictive maintenance, big data and big data analytics, and the impact of new approaches such as smart manufacturing at the 28th Annual U.S. APC Conference.

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Nanochip Express - Fall 2016

Upcoming Applied Global Services Events

See us at our upcoming Applied Global Services Fall Events

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