Applied’s ALD solutions deposit materials on the wafer one fraction of a monolayer at a time to create ultra-thin layers in advanced transistor, memory and interconnect applications.
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Applied’s CMP systems use a combination of physical abrasion and chemical erosion to remove material from the surface of a wafer so that subsequent processing can begin from a flat surface.
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Applied's CPD technology enables gentle, uniform doping over complex 3D chip structures.
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Applied’s dielectric deposition systems use chemical vapor deposition (CVD) technology to deposit insulating materials onto semiconductor wafers.
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Applied’s plasma etch systems are used to selectively remove material from the surface of a wafer in areas that have been defined by the lithography process.
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Applied’s inspection systems are used to detect particles and process-induced defects that can occur on wafers or photomasks during fabrication.
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Applied Materials’ Varian ion implantion systems modify the electrical characteristics of materials by embedding dopant ions in the wafer surface.
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Applied offers systems for the fabrication and inspection of advanced photomasks used by a lithography system to define circuit patterns on the wafer.
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Applied’s metallization systems deposit conductive metal and metal alloys to create circuit features such as interconnects, transistor contacts and through-silicon vias (TSVs).
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Applied’s metrology systems are used to measure the physical dimensions of circuit features to determine if they meet specifications.
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Applied’s thermal processing systems are used to elevate the temperature of the wafer and drive chemical reactions that will modify the properties of deposited films.
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