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AKT® eBeam Array Test

The AKT Electron Beam Array Test (EBT) system provides dynamic pixel and thin film transistor (TFT) characterization and functional tests of flat panel matrix in mass production. Testing platforms for all generations of glass substrate sizes from Gen 5 (1.5m2) to Gen 10 (10m2) are available.

With minimal mechanical motion the AKT EBT TFT array tester realizes high-reliability, low scheduled down time and low running cost. The e-beam array test systems feature fast, large area beam positioning with several e-beams in parallel, achieving high-throughput. Ultimate small beam spot size and accuracy beam positioning enable ultra-high resolution applications without limiting further reduction of pixel size as resolution of displays increases. The systems’ non-contact test technology ensures safe testing of high-value LCD and OLED panels without damaging or scratching the display.