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nanochip fab solutions

Nanochip Express, October 2016

Nanochip Express - Fall 2016

Chamber Matching—Easier Said Than Done

By Kevin Sannes

It seems easy enough: to maximize production of a given product, simply optimize the operating parameters of one “golden” tool and then duplicate them exactly across all the tools in the fleet to obtain perfectly matched performance. However, chamber matching is a prime example of the axiom "easier said than done."

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Nanochip Express - Fall 2016

Micro-Arcing During High-Density Plasma Chemical Vapor Deposition

By Calvin Chang, Joseph Farah and Lin Zhang

This article discusses micro-arcing and a new service strategy to help device makers manage particle contamination, wafer scrap, yield loss and tool downtime.

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Nanochip Express - Fall 2016

Inspecting Solar Wafers: You Can't Fix What You Can't See

By Asaf Schlezinger

Innovative inspection and yield-management tools for solar manufacturers help boost yields and produce higher-quality products

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Nanochip Express - Fall 2016

28th Annual U.S. APC Conference: Challenges and Practical Solutions in Advanced Process Control

By Nanochip Staff

Get the latest information on fault detection (FD) control, run-to-run (R2R) control, predictive technologies including virtual metrology and predictive maintenance, big data and big data analytics, and the impact of new approaches such as smart manufacturing at the 28th Annual U.S. APC Conference.

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Nanochip Express - Fall 2016

Upcoming Applied Global Services Events

See us at our upcoming Applied Global Services Fall Events

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