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Helen Armer

Helen Armer

Applied Knowledge Base Director


Significant technical expertise in process, chamber and tool design and analysis, throughput simulation, COO analysis and patent portfolio management.

About Helen

A 25-year veteran of the semiconductor equipment industry, Helen Armer leads the vital Applied Knowledge Base management function in support of the FabVantage consulting team. She is instrumental in building and managing Applied’s vast knowledge base to support benchmarking, modeling and best-known-method capabilities, and ensuring protection of intellectual property, all of which are critical to helping customers resolve complex problems in the fab. Additionally, she provides training content for Applied technical field support training and certification. Most recently, Helen has been working on developing parts usage benchmarks for Applied Materials tools and understanding what drives higher parts usage among certain segments.

Recent published works

  • "Strong Engineering Foundations Supports Yield Improvement"
    Nanochip Fab Solutions, December 2012
  • "Predictable Downtime and Increased Throughput on Constraint Tools Improve Total Fab Output"
    Nanochip Fab Solutions, November 2011


Tulane University PhD – Chemical Engineering