The Applied Producer Optiva system further expands Applied’s suite of low-temperature films for through-silicon via technology, while its unique polymer compatibility and superior conformality offers the most advanced microlens protective coating for backside illuminated sensors.
A 1nm pixel size enables high-quality imaging of 10nm defects while automatic defect redetection filters out nuisances and improves excursion monitoring for rapid root-cause determination. Fully automated operation reduces defect review time by up to 35%.
The Applied Producer Onyx system for low-k and ultra-low k dielectric films uses a unique designer chemistry and power source to treat films, lowering the dielectric constant and enhancing the film strength at the atomic level.