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2016 Metrology & Inspection Japan Techincal Symposium | Tokyo, Japan (Dec.15)

Applied Materials | Event Invitation
 
METROLOGY & INSPECTION
TECHNICAL SYMPOSIUM

December 15, 2016

Exploring Advanced Metrology and Inspection for Process Control

Applied Materials invites you to join us for a technical symposium and reception at the Shangri-La Hotel Tokyo.

Register Now

Following a strategic overview of inspection and metrology solutions for the Japanese semiconductor industry, Applied Materials technologists will address metrology advances for 3D and HAR applications, advanced optical inspection, and defect review with automatic defect classification and analysis. Guest speaker, Dr. Hiroshi Akahori of Toshiba, will make a special presentation on the use of big data in manufacturing innovation for memory.

We look forward to welcoming you!

 

 
MIJTS
 
PROGRAM DETAILS
Shangri-La Hotel Tokyo
Marunouchi Trust Tower Main,
1-8-3 Marunouchi Chiyoda-ku,
Tokyo, Japan
Shangri-La Ballroom, 27F
DECEMBER 15, 2016
12:30 – 13:00 PMRegistration
13:00 – 17:00 PMMetrology & Inspection Technical Symposium
17:00 – 19:00 PMReception
(and Poster Session)

View Agenda


For questions, email Isabelle_Hwang@amat.com