METROLOGY & INSPECTION
December 15, 2016
Exploring Advanced Metrology and Inspection for Process Control
Applied Materials invites you to join us for a technical symposium and reception at the Shangri-La Hotel Tokyo.
Following a strategic overview of inspection and metrology solutions for the Japanese semiconductor industry, Applied Materials technologists will address metrology advances for 3D and HAR applications, advanced optical inspection, and defect review with automatic defect classification and analysis. Guest speaker, Dr. Hiroshi Akahori of Toshiba, will make a special presentation on the use of big data in manufacturing innovation for memory.
We look forward to welcoming you!