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Juergen Frosien

Juergen Frosien

Head of Integrated Circuit Testing R&D
Process Diagnostics and Control

Dr. Juergen Frosien was named an Applied Materials Fellow in 2006. He is head of Integrated Circuit Testing (ICT) R&D for Applied Materials and manages ICT GmbH, a subsidiary of Applied Materials Israel’s Process Diagnostics and Control (PDC) division. Together with his team, he is responsible for the development and production of all E-Beam columns for PDC products, including: SEMVision G4, CD SEM Verity 4i and the Elite multi-column Electron Beam Inspection.

Dr. Frosien received the Applied Materials Hall of Fame Patent Award in 2008 for the invention of the SEMVision column, the PDC division’s most successful product to date. Since joining t in 2002, he has filed 43 patent applications and has been granted 35 U.S patents.

Dr. Frosien holds a Ph.D. in engineering from the Technical University of Berlin, Germany and is considered one of the world’s leading experts in Charged Particles Optics.